Abstract
One-dimensional (1D) phased arrays are widely used in NDT industries, but they have numerous limitations due to their element layout. Two-dimensional (2D) phased arrays have yet to become widely deployed in NDE industries, despite the many benefits they bring, such as volumetric imaging from a single array location and the potential for more defect information to be captured. In this work, a sparse 2D phased array is used to accurately image the interior of a specimen with a doubly-curved surface. The array is mechanically scanned across the surface, which is extracted using an imaging algorithm with an absolute error of less than 0.07 mm. The extracted surface is then used to focus within the component and the positioning of defects is investigated using two metrics: the depth above the back wall and the lateral distance from the surface notch. The standard deviation of depth and lateral position measurements of visible defects is 1.16 mm and 0.97 mm respectively.
How to Cite:
McKee, J. G., Bevan, R. L., Wilcox, P. D. & Malkin, R. E., (2019) “Volumetric imaging of defects through a non-planar surface”, Review of Progress in Quantitative Nondestructive Evaluation .
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